Full-field microimaging with 8 keV X-rays achieves a spatial resolutions better than 20 nm.

نویسندگان

  • Tsung-Yu Chen
  • Yu-Tung Chen
  • Cheng-Liang Wang
  • Ivan M Kempson
  • Wah-Keat Lee
  • Yong S Chu
  • Y Hwu
  • G Margaritondo
چکیده

Fresnel zone plates (450 nm thick Au, 25 nm outermost zone width) used as objective lenses in a full field transmission reached a spatial resolution better than 20 nm and 1.5% efficiency with 8 keV photons. Zernike phase contrast was also realized without compromising the resolution. These are very significant achievements in the rapid progress of high-aspect-ratio zone plate fabrication by combined electron beam lithography and electrodeposition.

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عنوان ژورنال:
  • Optics express

دوره 19 21  شماره 

صفحات  -

تاریخ انتشار 2011